ECE 658: Semiconductor Material And Device Characterization

3 credits

Spring 2022 Lecture
Data from
Spring 2022
last updated 8/23/2024
Spring 2022 Instructors:

A comprehensive survey of modern characterization techniques routinely used to determine solid-state material and device parameters. Concepts and theory underlying the techniques are examined, and sample experimental results are presented. The coverage includes electrical, optical, chemical, and physical characterization methods. Offered in alternate years. Prerequisite: ECE 60600.

Course ECE 658 from Purdue University - West Lafayette.

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Graduates

GPA by professor

M

Peide Ye

001
8:30 am
Lec
W

Peide Ye

001
8:30 am
Lec
F

Peide Ye

001
8:30 am
Lec

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ECE 658: Semiconductor Material And Device Characterization